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Fast Multi-Modal Reuse: Co-Occurrence Pre-Trained Deep Learning Models
Conference
Iyer, Vasanth, Aved, Alexander, Howlett, Todd B
et al
. (2019). Fast Multi-Modal Reuse: Co-Occurrence Pre-Trained Deep Learning Models .
SMART BIOMEDICAL AND PHYSIOLOGICAL SENSOR TECHNOLOGY XI,
10996 10.1117/12.2519546
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Iyer, Vasanth, Aved, Alexander, Howlett, Todd B
et al
. (2019). Fast Multi-Modal Reuse: Co-Occurrence Pre-Trained Deep Learning Models .
SMART BIOMEDICAL AND PHYSIOLOGICAL SENSOR TECHNOLOGY XI,
10996 10.1117/12.2519546
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Overview
cited authors
Iyer, Vasanth; Aved, Alexander; Howlett, Todd B; Carlo, Jeffrey T; Mehmood, Asif; Pissinou, Niki; Iyengar, SS
authors
Iyengar, S.S.
Pissinou, Niki
date/time interval
April 15, 2019 -
publication date
January 1, 2019
published in
ADVANCED BIOMEDICAL AND CLINICAL DIAGNOSTIC SYSTEMS VII
Book
Research
keywords
Autoencoder
Jaccard Similarity
Minhashing
Optics
Physical Sciences
Science & Technology
Semantic Hashing
Sensor Selection
Location
Location
MD, Baltimore
Identifiers
Digital Object Identifier (DOI)
https://doi.org/10.1117/12.2519546
Additional Document Info
Conference
Conference on Real-Time Image Processing and Deep Learning
publisher
SPIE-INT SOC OPTICAL ENGINEERING
volume
10996